Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists
Author: Zhili, Dong
ISBN: 9780367357948
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Title
RM928.20
Publisher,CRC Pr I Llc
Publication Date,
Format, Hardcover
Weight, 544.31 g
No. of Pages, 266
The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. Written as an introduction to the topic with minimal reliance on advanced mathematics, the book will appeal to a broad spectrum of readers, including students, engineers, and researchers in materials science and engineering, applied physics, and chemical engineering. It can be used in XRD and TEM lab training--