MOS Interface Physics, Process and Characterization
Author: Wang, Shengkai/ Wang, Xiaolei
ISBN: 9781032106274
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Title
RM850.85
Publisher,CRC Pr I Llc
Publication Date,
Format, Hardcover
Weight, 362.87 g
No. of Pages, 161
The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices and integrated circuits is high quality MOS structure. This book contains abundant experimental examples focusing on MOS structure. The volume will be an essential reference for academics and postgraduates within the field of microelectronics--